CarlBerk offers a full spectrum of characterization and testing services through our in-house laboratory and collaborative partner labs. Typical analytical techniques we employ to support our analytical service include:

Chemical Characterization Physical Characterization Microscopy Electrical Characterization
FTIR DSC Optical Microscopy I-V Curve
Raman Spectroscope TGA 2D X-ray EIS
EDS TMA 3D CT Microscope OBIRCH
XPS DMA SEM Thermo IR
TOF-SIMS Rheology Cross-section Polishing EMMI
GC-MS XRD Dual-beam FIB/SEM TLP
ICP-MS/OES C-SAM EBSD SIR
Titrator Mechanical Test TEM/STEM SQUID

Besides these basic tools, CarlBerk team also develops innovative solutions and packages of proprietary analysis protocols through collaboration with research institute and instrument manufacturers, allowing us to perform customized analysis that is not otherwise commercially available.

Feature Techniques

Cryo-FIB/SEM Workstation
Cryo-FIB/SEM Workstation
Cross-section Polishing
Cross-section Polishing
Pyrolysis GC-MS
Pyrolysis GC-MS
In-situ Mechanical Testing
In-situ Mechanical Testing
Modulated Differential Scanning Calorimetry (MDSC)
Modulated Differential Scanning Calorimetry (MDSC)

MDSC superimposes an oscillation upon a linear temperature ramp, which allows detection of subtle transitions that could otherwise well characterized by conventional DSC. For example, MDSC could deconvolute overlapping transitions and thus avoid signal interference from multiple transitions.


Aberration-corrected Analytical TEM
Aberration-corrected Analytical TEM

Aberration-corrected TEM is non-replaceable tools for material exploration and investigation at nanometer scale. Together with the integration of energy dispersive X-ray spectroscopy and electron energy loss spectroscopy, material structure and chemistry can be determined with atomic resolution.


Fourier Transform IR Spectroscopy at Nanometer Scale (Nano-FTIR)
Fourier Transform IR Spectroscopy at Nanometer Scale (Nano-FTIR)

Nano-FTIR utilizes the scanning near-field optical microscopy and atomic force microscopy to produce localized light-matter interaction, allowing a much fine IR resolution (less than 10 nm). This technique is useful for precise chemical analysis of ultra-fine particulates and contaminants.